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Bibliographia Humboldtiana Index

Bibliographia Humboldtiana

II. Publications by Humboldt Research Fellows from Germany in 2009

Electrical, electronic and communications engineering

Görrn, Prof. Dr.-Ing. Patrick

Bergische Universität Wuppertal, Germany
Field of research: Electrical (and electronic) engineering
Host: Prof. Dr. Sigurd Wagner Princeton University
  • Patrick Görrn, Thomas Riedl, Wolfgang Kowalsky: Encapsulation of Zinc Tin Oxide based Thin Film Transistors . In: J. Phys. Chem. C. 113, 2009, p. 11126 - 11130 [amorphous oxide semiconductors, thin film transistor, chemisorption, stability, encapsulation].

  • Thomas Riedl, Patrick Görrn, Wolfgang Kowalsky: Transparent Electronics for See-Through AMOLED Displays. In: IEEE/OSA J. Displ. Technol. . 5(12), 2009, p. 501 - 508 [amorphous oxide semiconductors, zinc tin oxide, thin film transistor, transparent electronics, OLED displays, stability ].

Lemme, Prof. Dr.-Ing. Max Christian

Rheinisch-Westfälische Technische Hochschule Aachen, Germany
Field of research: Electrical (and electronic) engineering
Host: Prof. Dr. Charles M. Marcus Harvard University
  • Max C. Lemme, David C. Bell, James R. Williams, Lewis A. Stern, Britton W. H. Baugher, Pablo Jarillo-Herrero, Charles M. Marcus: Etching of Graphene Devices with a Helium Ion Beam. In: ACS Nano. 3, 2009, p. 2674 - 2676 [graphene, helium ion microscope].

  • David C. Bell, Max C. Lemme, Lewis A. Stern, James R. Williams, Charles M. Marcus: Precision cutting and patterning of graphene with helium ions. In: Nanotechnology. 20, 2009, p. 455301 [graphene, helium ion microscope].

  • David C. Bell, Max C. Lemme, Lewis A. Stern, Charles M. Marcus : Precision material modification and patterning with He ions . In: Journal of Vacuum Science and Technology B. 27, 2009, p. 2755 - 2758 [graphene, helium ion microscope].