| 2006 | Jakub Cizek, Ivan Prochazka, Gerhard Brauer, Wolfgang Anwand, Arndt Mücklich, Reiner Kirchheim, Astrid Pundt, Carsten Bähtz, Michael Knapp: Defect Studies of Hydrogen-Loaded Thin Nb Films. In: Applied Surface Science , 2006, 3237-3244 |
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| 2006 | Jakub Cizek, Oksana Melikhova, Ivan Prochazka, Gerhard Brauer, Wolfgang Anwand, Arndt Mücklich, Reiner Kirchheim, Astrid Pundt: Defects in Nanocrystalline Nb Films: Effect of Sputtering Temperature. In: Applied Surface Science, 2006, 3245-3251 |
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| 2006 | Jakub Cizek, Ivan Prochazka, Gerhard Brauer, Wolfgang Anwand, Arndt Mücklich, Reiner Kirchheim, Astrid Pundt, Carsten Bähtz, Michael Knapp: Study of Hydrogen-Defect Interaction in Thin Nb Film on Si Substrate Using Positron Annihilation. In: Materials Structure in Chemistry. Biology. Physics and Technology , 2006, 82-89 |
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| 2005 | Jakub Cizek, Ivan Prochazka, Radomir Kuzel, Frantisek Becvar, Miroslav Cieslar, Gerhard Brauer, Wolfgang Anwand, Reiner Kirchheim, Astrid Pundt: Hydrogen-Induced Defects in Niobium Studied by Positron Annihilation Spectroscopy. In: Journal of Alloys and Compounds , 2005, 580-583 |
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| 2004 | Jakub Cizek, Ivan Prochazka, Radomir Kuzel, Frantisek Becvar, Miroslav Cieslar, Gerhard Brauer, Wolfgang Anwand, Reiner Kirchheim, Astrid Pundt: Hydrogen-Induced Defects in Niobium Studied by Positron Annihilation. In: Material Science Forum, 2004, 60-62 |
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| 2004 | Jakub Cizek, Ivan Prochazka, Frantisek Becvar, Radomir Kuzel, Miroslav Cieslar, Gerhard Brauer, Wolfgang Anwand, Reiner Kirchheim, Astrid Pundt: Hydrogen-induced defects in bulk niobium. In: Physical Review B, 2004, 224106 |
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| 2002 | Jakub Cizek, Ivan Prochazka, Miroslav Cieslar, Ivana Stulikova, Frantisek Chmelik, Rinat K. Islamgaliev: Positron-Lifetime Investigation of Thermal Stability of Ultra-Fine Grained Nickel. In: physica status solidi (a), 2002, 391-408 |
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| 2001 | M. Dornheim, N. Jisrawi, K. Northemann, O. Dankert, J. Cizek, J. Bankmann, C. Bahtz, M. Knapp, A. Pundt: Non-equilibrium behavior and phase boundaries in Yttrium-H, Gadolinium-H and Niobium-H thin films . In: Hasylab Annual Report 2001, part I, 2001, |
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