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Profile
| Academic position | Full Professor |
|---|---|
| Research fields | Computer Architecture, Embedded and Massively Parallel Systems,Electronic Semiconductors, Components and Circuits, Integrated Systems, Sensor Technology, Theoretical Electrical Engineering,Communication Technology and Networks, High-Frequency Technology and Photonic Systems, Signal Processing and Machine Learning for Information Technology |
| Keywords | discreet optimization, microfluids, wireless sensor networks, embedded systems, VLSI design and test |
Current contact address
| Country | United States of America |
|---|---|
| City | Tempe |
| Institution | Arizona State University (ASU) |
| Institute | School of Electrical, Computer and Energy Engineering |
Host during sponsorship
| Prof. Dr. Michael Gössel | Institut für Informatik und Computational Science, Universität Potsdam, Potsdam |
|---|---|
| Prof. Dr. Rolf Drechsler | Fachbereich 03 - Mathematik und Informatik, Universität Bremen, Bremen |
| Prof. Dr. Bernd Becker | Institut für Informatik, Albert-Ludwigs-Universität Freiburg, Freiburg |
| Prof. Dr. Mehdi B. Tahoori | Institut für Hochfrequenztechnik und Elektronik (IHE), Karlsruher Institut für Technologie (KIT), Karlsruhe |
| Start of initial sponsorship | 01/02/2004 |
Programme(s)
| 2003 | Humboldt Research Fellowship Programme |
|---|---|
| 2013 | Humboldt Research Award Programme |
Nominator's project description
| Professor Chakrabarty is an international authority in integrated circuit testing. He has made outstanding contributions to increase the testability of complex system-on-chips. In addition, Professor Chakrabarty is a leading expert in the field of emerging technologies. He pioneered many techniques to optimize microfluidic bio-chips and wireless sensor networks. During his stay in Germany, he intends to focus on the development of new techniques to increase the test quality of nanoscale designs. |
Publications (partial selection)
| 1994 | Michael Goessel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger: Identification of failing vectors using signature analysis with application to scan-BIST. In: Journal of Electronic Testing: Theory and Applications, 1994, 611-622 |
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