Dr. Takuya Hosokai

Profile

Academic positionLecturer, Assistant Professor, Researcher
Research fieldsSurface Physics,Spectroscopy
KeywordsUltrafast spectroscopy, Optical seoctroscopy, Organic semiconductor, Photoelectron spectroscopy, Surface X-ray scattering

Current contact address

CountryJapan
CityTsukuba
InstitutionNational Institute of Advanced Industrial Science and Technology (AIST)
InstituteResearch Institute for Material and Chemical Measurement
Homepagehttps://www.aist.go.jp/index_en.html

Host during sponsorship

Prof. Dr. Dr. h.c. Frank SchreiberFakultät für Physik, Institut für Angewandte Physik, Bereich Röntgen- und Neutronenstreung, Eberhard Karls Universität Tübingen, Tübingen
Start of initial sponsorship01/11/2008

Programme(s)

2008Humboldt Research Fellowship Programme for Postdocs

Publications (partial selection)

2011T. Hosokai, H. Machida, A. Gerlach, S. Kera, F. Schreiber, N. Ueno: Impact of spontaneous structural imperfections on the energy level alignment. In: Physical Review B, 2011, 195310
2011A. Habib, T. Hosokai, N. Mitsuo, R. Nakagawa, S. Nagamatsu, M. Aoki, S. Masuda, S. Kera, N. Ueno: Observation and Analysis of Small Inclination of Thymine Molecules on Graphite. In: Journal of Physical Chemistry C, 2011, 511-515
2011A. Gerlach, T. Hosokai, S. Duhm, S. Kera, O. T. Hofmann, E. Zojer, J. Zegenhagen, F. Schreiber: Orientation Ordering of Non-Planar Phthalocyanines on Cu(111): Strength and Orientational of the Electric Dipole Moment. In: Physical Review Letters, 2011, 156102
2011A. Hinderhofer, C. Frank, T. Hosokai, A. Resta, A. Gerlach, F. Schreiber: Structure and morphology of coevaporated pentacene-perfluoropentacene thin films. In: Journal of Chemical Physics, 2011, 104702
2010S. Gotovac-Atlagić, T. Hosokai, T. Ohba, Y. Ochiai, H. Kanoh, N. Ueno, K. Kaneko: Pseudometallization of single wall carbon nanotube bundles with intercalation of naphthalene. In: Physical Review B, 2010, 075136
2010T. Hosokai, A. Gerlach, A. Hinderhofer, C. Frank, G. Ligorio, U. Heinemeyer, A. Vorobiev, F. Schreiber.: Simultaneous in situ measurements of X-ray reflectivity and optical spectroscopy during organic semiconductor thin film growth . In: Applied Physics Letters, 2010, 063301-063303