Dr. Martin Hodas

Profile

Academic positionPost Doc
Research fieldsSurface Physics
Keywordsepitaxially grown graphene, MoS2, pentacene, organic thin films, perfluoropentacene

Current contact address

CountrySlovakia
CityStupava

Host during sponsorship

Prof. Dr. Dr. h.c. Frank SchreiberFakultät für Physik, Institut für Angewandte Physik, Bereich Röntgen- und Neutronenstreung, Eberhard Karls Universität Tübingen, Tübingen
Start of initial sponsorship01/07/2018

Programme(s)

2018Humboldt Research Fellowship Programme for Postdocs

Publications (partial selection)

2021Reisz, Berthold and Belova, Valentina and Duva, Giuliano and Zeiser, Clemens and Hodas, Martin and Hagara, Jakub and Siffalovic, Peter and Pithan, Linus and Hosokai, Takuya and Hinderhofer, Alexander and Gerlach, Alexander and Schreiber, Frank: Polymorphism and structure formation in copper phthalocyanine thin films. In: J Appl Crystallogr, 54, 2021, 203-210
2020Katrin Ortstein, Sebastian Hutsch, Alexander Hinderhofer, Jörn Vahland, Martin Schwarze, Sebastian Schellhammer, Martin Hodas, Thomas Geiger, Hans Kleemann, Holger F. Bettinger, Frank Schreiber, Frank Ortmann, Karl Leo: Energy Level Engineering in Organic Thin Films by Tailored Halogenation. In: Advanced Functional Materials, 2020, 2002987
2020Hagara, Jakub and Mrkyvkova, Nada and Feriancová, Lucia and Putala, Martin and Nádaždy, Peter and Hodas, Martin and Shaji, Ashin and Nádaždy, Vojtech and Huss-Hansen, Mathias K. and Knaapila, Matti and Hagenlocher, Jan and Russegger, Nadine and Zwadlo, Matthias and Merten, Lena and Sojková, Michaela and Hulman, Martin and Vlad, Alina and Pandit, Pallavi and Roth, Stephan and Jergel, Matej and Majková, Eva and Hinderhofer, Alexander and Siffalovic, Peter and Schreiber, Frank: Novel highly substituted thiophene-based n-type organic semiconductor: structural study{,} optical anisotropy and molecular control. In: CrystEngComm, 22, 2020, 7095-7103
2020Jakub Hagara, Nada Mrkyvkova, Peter Nadazdy, Martin Hodas, Michal Bodik, Matej Jergel, Eva Majkova, Kamil Tokar, Peter Hutar, Michaela Sojkova, Andrei Chumakov, Oleg Konovalov, Pallavi Pandit, Stephan Roth, Alexander Hinderhofer, Martin Hulman, Peter Siffalovic and Frank Schreiber: Reorientation of p-conjugated molecules on few-layer MoS2 films. In: Physical Chemistry Chemical Physics, 2020, 3097-3104
2020Mrkyvkova, Nada and Nadazdy, Peter and Hodas, Martin and Chai, Jianwei and Wang, Shijie and Chi, Dongzhi and Sojkova, Michaela and Hulman, Martin and Chumakov, Andrei and Konovalov, Oleg V. and Hinderhofer, Alexander and Jergel, Matej and Majkova, Eva and Siffalovic, Peter and Schreiber, Frank: Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering. In: Crystal Growth \& Design, 20, 2020, 5269-5276
2020Fetzer, Florian and Maier, Andre and Hodas, Martin and Geladari, Olympia and Braun, Kai and Meixner, Alfred J. and Schreiber, Frank and Schnepf, Andreas and Scheele, Marcus: Structural order enhances charge carrier transport in self-assembled Au-nanoclusters. In: Nat Commun, 11, 2020,
2020Mathias Kasper Huss-Hansen, Martin Hodas, Nada Mrkyvkova, Jakub Hagara, Bjarke Bror Egede Jensen, Andreas Osadnik, Arne Luetzen, Eva Majkova, Peter Siffalovic, Frank Schreiber, Luciana Tavares, Jakob Kjelstrup-Hansen, Matti Knaapila: Surface-Controlled Crystal Alignment of Naphthyl End-Capped Oligothiophene on Graphene: Thin-Film Growth Studied by In Situ X-ray Diffraction. In: Langmuir, 2020,
2019Nada Mrkyvkova, Martin Hodas, Jakub Hagara, Peter Nadazdy, Yurij Halahovets, Michal Bodik, Karol Tokar, J. W.Chai, S. J.Wang, D. Z.Chi, Andrei Chumakov, Oleg Konovalov, Alexander Hinderhofer, Matej Jergel, Eva Majkova, Peter Siffalovic, and Frank Schreiber: Diindenoperylene thin-film structure on MoS2 monolayer. In: Applied Physics Letters, 2019, 251906-1-251906-5
2019Santanu Maiti, Alexander André, Sonam Maiti, Martin Hodas, Maciej Jankowski, Marcus Scheele, and Frank Schreiber: Revealing structure and crystallographic orientation of soft epitaxial assembly of nanocrystals by grazing incidence X-ray scattering. In: Journal of Physical Chemistry Letters, 2019,