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Aktuelle Kontaktadresse
| Land | USA |
|---|---|
| Ort | Newark |
| Universität/Institution | New Jersey Institute of Technology |
| Institut/Abteilung | Department of Physics |
Profil
| Fachgebiet | Halbleiterphysik |
|---|---|
| Keywords | X-ray diffraction, Multiferroics, Far-IR spectroscopy, Ellipsometry, Raman scattering |