Prof. Dr. Jan Schmidt

Profil

Derzeitige StellungProfessor W-3 und Äquivalente
FachgebietHalbleiterphysik,Energieverfahrenstechnik (einschließlich Kerntechnik/-energie)
KeywordsDefects in semiconductors, Device simulation, Photovoltaics, Solar cells, Surface passivation

Aktuelle Kontaktadresse

LandDeutschland
OrtEmmerthal
Universität/InstitutionInstitut für Solarenergieforschung GmbH (ISFH)

Gastgeber*innen während der Förderung

Prof. Dr. Andrew William BlakersCentre for Sustainable Energy Systems, Dept. of Engineering, FEIT, Australian National University, Canberra
Beginn der ersten Förderung16.10.1998

Programm(e)

1998Feodor Lynen-Forschungsstipendien-Programm

Publikationen (Auswahl)

2005J. E. Birkholz, K. Bothe, D. Macdonald, and J. Schmidt: Electronic properties of iron-boron pairs in crystalline silicon by temperature- and injection-level-dependent lifetime measurements. In: J. Appl. Phys., 2005, 103708-1-103708-6
2005D. Macdonald, T. Roth, P. N. K. Deenapanray, K. Bothe, P. Pohl, Jan Schmidt: Formation rates of iron-acceptor pairs in crystalline silicon. In: J. Appl. Phys., 2005, 083509-1-083509-5
2005J. Schmidt and D. Macdonald: Recombination activity of iron-gallium and iron-indium pairs in silicon. In: J. Appl. Phys., 2005, 113712-1-113712-9
2001Jan Schmidt, M. Kerr: Highest-quality surface passivation of low-resistivity p-type silicon using stoichiometric PECVD silicon nitride. In: Solar Energy Materials and Solar Cells, 2001, 585-591
2001Jan Schmidt, I. Dierking: Localization and imaging of local shunts in solar cells using polymer-dispersed liquid crystals. In: Prog. Photovolt., 2001, 263-271
2001Jan Schmidt, M. Kerr, A. Cuevas: Surface passivation of Si solar cells using plasma-enhanced chemical vapor deposited SiN films and thermal SiO2/plasma SiN stacks. In: Semiconductor Sience and Technology, 2001, 164-170
2001M. Kerr, J. Schmidt, A. Cuevas, J. H. Bultman: Surface recombination velocity of phosphorus-diffused silicon solar cell emitters passivated with plasma enhanced chemical vapor deposited silicon nitride and thermal silicon oxide. In: J. Appl. Phys., 2001, 3821-3826
2000M. Kerr, J. Schmidt, A. Cuevas: Comparison of the open circuit voltage of simplified PERC cells passivated with PECVD silicon nitride and thermal silicon oxide. In: Prog. Photovolt., 2000, 529-536
2000Jan Schmidt, M. Kerr, P. P. Altermatt: Coulomb-enhanced Auger recombination in crystalline silicon at intermediate and high injection densities. In: J. Appl. Phys., 2000, 1494-1497