| 2013 | Zhang F., Zhang R. J*., Wang Z. Y., Zheng Y.X., et al.: Structural Characterization and Optical Properties of Sol-gel-derived Polycrystalline Pb(Zr0.35Ti0.65)O3 Thin Films. In: J. Korean Physical Society, 2013, 53-57 |
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| 2012 | Mao P.H.,Zheng Y.X.,Cai Q.Y.,Zhang D.X.Zhang R.J., et al.
: Approach to Error Analysis and Reduction for Rotating-Polarizer-Analyzer Ellipsometer. In: J.of the Phys. Society of Japan, 2012, 124003 |
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| 2012 | Wu K.N.,Zheng Y.X.,Zhang D.X,Tao Y.H, Zhang R. J. et al.: A Virtual Optical Encryption System Based on Polarization Optics. In: J. Korean Physical Society, 2012, 1292-1296 |
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| 2012 | Yang W. J., Huang R. Z., Liu L., Wang L. F., Zhang, R. J., et al.: Double layers of H2 adsorption on an AlN sheet induced by electric field. In: J. Nanopart. Res. , 2012, 1256 |
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| 2012 | Huang, Chan-yan; Tao, Jun-chao; Sun, Yan; Zhang Rong-Jun et al.: Incubating non-prefabricated nanocrystals in anodized nanotubes for TiO2 nano-hybrids. In: Colloids and Surfaces a-Physicochemical and Engineering , 2012, 244-250 |
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| 2012 | Y. X. Zheng*, R. J. Zhang* and L. Y. Chen: Stoichiometry and Materials Science - When Numbers Matter. Chap. 3: Ellipsometry and its applications in stoichiometry. InTech Open Access Company, 2012 |
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| 2012 | Zhang, Dong-Xu; Zheng, Yu-Xiang; Cai, Qing-Yuan;Lin W;Wu K.N; Mao P.H; Rong-Jun Zhang et al.: Thickness-dependence of optical constants for Ta2O5 ultrathin films. In: Applied Physics a-Materials Science & Processing , 2012, 975-979 |
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| 2011 | Cai Q. Y., Zheng Y. X., Zhang D. X., Lu W. J. and Zhang R.J. et al., Application of image spectrometer to in situ infrared broadband optical monitoring for thin film deposition . In: Optics Express, 2011, 12969-12977 |
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| 2011 | Yu X., Zhang R. J*. et al., Optical constants and band gap expansion of size controlled silicon nanocrystals embedded in SiO2 matrix . In: J. Non-Crystalline Solids, 2011, 3524-3527 |
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| 2010 | Cai Q.Y., Zheng Y. X., Mao P. H. and Rong-Jun Zhang: Evolution of optical constants of silicon dioxide on silicon from ultrathin films to thick films. In: J. Phys. D:Appl. Phys., 2010, 445302 |
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| 2010 | Lu W. J. and Rong-Jun Zhang* et al., Nonlinear optical properties of silicon nanocrystals growen by using a SiOx/SiO2 superlattices approach.. In: J. Korean Physics Society, 2010, 1303-1306 |
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| 2010 | Tan Xiao-Hua, Jin Bin-Long and Rong-Jun Zhang: Well-designed of UWB suspended substrate stripline highpass filters. In: Proc. of 2010 IEEE International conf. on Ultra-Wideband, (2010) 978-1-4244-5306-1, 2010, 1-3 |
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| 2009 | Se-Young Seo,
Rong-Jun Zhang et al.: Far-field observation of the radial profile of visible whispering-gallery modes in a single microdisk based on Si-nanocrystal/SiO2 superlattices. In: J. Appl. Phys., 2009, 123102 |
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| 2009 | Wei-Jie Lu,
Rong-Jun Zhang et al.: Design and realization of extansive optical thin film mapping measurement platform. In: Chinese Journal of Lasers, 2009, 1555-1558 |
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| 2009 | Li X. L., Yang G.Q., Chen J., Zhang R. J Zhou W. M., Liu Y. B., Zhang I., and Wang Q. K., Enhanced light extraction from colloidal ZnO QD film by adding on photonic crystals using UV-Nanoimprint lithography. In: Surface Review & Letters, 2009, 367-373 |
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| 2009 | Sun Y., Chen X., Yue Y., Zhang R.J., and Dai N.: Flexible Aluminum Nanobowls for Alternative Preparation of Individual or a Small Number of Nanoparticles. In: CHEMICAL RESEARCH IN CHINESE UNIVERSITIES, 2009, 143-146 |
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| 2009 | Rong-Jun Zhang,
Yi-Ming Chen et al.: Influence of nanocrystal size on dielectric functions of Si nanocrystals embedded in SiO2 matrix. In: Appl. Phys. Lett., 2009, 161109 |
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| 2009 | Zhong-Hong Dai,
Rong-Jun Zhang et al.: Optical properties of Zinc oxide films determined using spectroscopic ellipsometry with various dispersion models. In: J. Korean Physics Society, 2009, 1227-1232 |
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| 2009 | Rong-Jun Zhang, Yi-Ming Chen et al.: Study and progress of Silicon luminescence. In: Chinese Journal of Lasers, 2009, 269-275 |
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| 2009 | Mao P. H., Zheng Y. X., Chen. Y. R., Cai Q. Y., Zhang R. J. and Chen L. Y.: Study of the new ellipsometric measurement method using integrated analyzer in parallel mode. In: OPTICS EXPRESS, 2009, 8641-8650 |
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| 2009 | Sun Y. H., Zhang B., Dai N., Si J. X., Wu H. Z., Zhang R. J. and Chen L. Y.: Temperature-dependent optical properties of Pb1-xMnxSe films epitaxially grown on Zn0.04Cd0.96Te substrates. In: JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 34-39 |
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| 2009 | Rong-Jun Zhang, Yu-Xiang Zheng et al.: The dispersion and attenuation measurement system for single mode optical fiber. In: Research and Exploration in Laboratory (in Chinese), 2009, 29-31 |
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| 2008 | Yi-Ming Chen, Rong-Jun Zhang et al.: Study on Optical Property of Bi3.15Nd0.85Ti3O12 Ferroelectric Thin Film. In: J. Korean Physics Society, 2008, 2299-2302 |
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| 2008 | Rong-Jun Zhang, Yi-Ming Chen et al.: The Effect of Narrow BandPass Filters Group Delay Ripples on WDM Optical Communication Systems. In: Elecrtonic Devices in Chinese, 2008, 312-314 |
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| 2007 | Li-Chen Jia, Peng-Hui Mao, Yu-Xiang Zheng, Rong-Jun Zhang and Liang-Yao Chen: Propagation Properties of a Gaussian Beam from a High-NA
Optical System in a Magneto-Optical Disk. In: Journal of the Korean Physical Society, 2007, 1524-1530 |
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| 2007 | Shou-Zhi Feng, Rong-Jun Zhang, Yu-Xiang Zheng, Jing Li, Peng-Hui Mao, Xiao-Fan Li and Liang-Yao Chen: Spectroscopic Ellipsometric Study of Size-Controlled Silicon
Nano-Crystals in SiO2 Composite Thin Film. In: J. Korean Physics Society, 2007, 1593-1597 |
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| 2006 | Xu C H.，Zheng Y X., Rong-Jun Zhang et al.: Comparison of the optical and thermal characteristics of a double-recording-ayered magneto-optical disk with different interlayers. In: J. Korean Physics Society, 2006, 2103-2107 |
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| 2006 | V.Yu. Timoshenko, D.M. Zhigunov, P.K. Kashkarov, O.A. Shalygina,
S.A. Teterukov, R.J. Zhang, M. Zacharias, M. Fujii, Sh. Hayashi: Photoluminescence properties of erbium-doped structures of
silicon nanocrystals in silicon dioxide matrix. In: Journal of Non-Crystalline Solids, 2006, 1192-1195 |
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| 2006 | T. Z. Lu,M. Alexe, R. Scholz, V. Talalaev, R. J. Zhang, and M. Zachariasb: Si nanocrystal based memories: Effect of the nanocrystal density. In: JOURNAL OF APPLIED PHYSICS, 2006, 014310 |
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| 2006 | Rong-Jun Zhang, Se-Young Seo, Alexey P. Milenin, Margit Zacharias, Ulrich Gösele: Visible range whispering-gallery mode in microdisk array based on size-controlled Si nanocrystals. In: Applied Physics Letters, 2006, 153120-1-153120-3 |
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